RESEARCH.FI

Synchrotron x-ray topography of electronic materials

Vertaisarvioitu

Tuomi, Turkka

Journal of Synchrotron Radiation

2002

Synchrotron X-ray topography of undoped VCz GaAs crystals

Vertaisarvioitu

Tuomi, T.; Knuuttila, L.; Riikonen, J.; McNally, P.J.; Chen, Weimin; Kanatharana, J.; Neubert, M.; R...

Journal of Crystal Growth

2002

Synchrotron x-ray topography of cuprite using conventional thin sections

Danilewsky, A.N.; Schropp, B.; Kek, S.; Tuomi, T.; Taskinen, M.; Rantamäki, R.; McNally, P.J.; Curle...

1997

Synchrotron x-ray topography of III-V semiconductors

Vertaisarvioitu

Tuomi, T.

2000

X-ray Topography of Semiconductors Using Synchrotron Radiation

Rantamäki, R.

Teknillinen korkeakoulu

1999

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

Vertaisarvioitu

Chen, W.M.; McNally, P.J.; Jacobs, K.; Tuomi, Turkka; Danilewsky, A.N.; Lowney, D.; Kanatharana, J.;...

2002

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

Vertaisarvioitu

Chen, W.M.; McNally, P.J.; Jacobs, K.; Tuomi, T.; Danilewsky, A.N.; Lowney, D.; Kanatharana, J.; Knu...

Materials Research Society Symposia Proceedings

2002

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

Chen, W.M.; McNally, P.J.; Jacobs, K.; Tuomi, T.; Danilewsky, A.N.; Lowney, D.; Kanatharana, J.; Knu...

2002

Dislocation analysis for heat-exchanger method grown sapphire with white beam synchrotron X-ray topography

Vertaisarvioitu

Chen, W.M.; McNally, P.J.; "Shvyd'ko", Uy.V.; Tuomi, T.; Danilewsky, A.N.; Lerche, M.

Journal of Crystal Growth

2003

Failure analysis of LED arrays using white beam synchrotron x-ray topography

Vertaisarvioitu

Lowney, D.; McNally, P.J.; "O'Hare", M.; Herbert, P.A.F.; Tuomi, T.; Rantamäki, R.; Karilahti, M.; D...

2000

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Synchrotron x-ray topography of electronic materials

Synchrotron X-ray topography of undoped VCz GaAs crystals

Synchrotron x-ray topography of cuprite using conventional thin sections

Synchrotron x-ray topography of III-V semiconductors

X-ray Topography of Semiconductors Using Synchrotron Radiation

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

Dislocation analysis for heat-exchanger method grown sapphire with white beam synchrotron X-ray topography

Failure analysis of LED arrays using white beam synchrotron x-ray topography

Synchrotron x-ray topography of electronic materials

Synchrotron X-ray topography of undoped VCz GaAs crystals

Synchrotron x-ray topography of cuprite using conventional thin sections

Synchrotron x-ray topography of III-V semiconductors

X-ray Topography of Semiconductors Using Synchrotron Radiation

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

Dislocation analysis for heat-exchanger method grown sapphire with white beam synchrotron X-ray topography

Failure analysis of LED arrays using white beam synchrotron x-ray topography